Electricity And Magnetism

Linear Elements of the Electromagnetic Pinhole Graphs by Barus C.

By Barus C.

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107. T. Schmidt, S. Heun, J. Slezak, J. C. Prince, G. Lilienkamp, and E. Bauer, Surf. Rev. Lett. 5, 1287 (1998). 108. G. Rossi, G. Panaccione, F. A. Cherepkov, Phys. Rev. B 55, 11483 (1997). 109. S. Fadley: Recent developments in photoelectron diffraction. In: J. Kanamori and A. ), Core-Level Spectroscopy in Condensed Systems, Springer, Berlin (1988). 110. S. Fadley, Surf. Sci. Rep. 19, 231 (1993). 111. H. Daimon, T. Nakatani, S. Imada, S. Suga, Y. Kagoshima, and T. Miyahara, Rev. Sci. Instrum.

The present chapter takes a new look at an old problem, utilizing X-ray spectroscopy and microscopy methods that have only recently been developed. The spectromicroscopy approach, utilized here, combines two well-established concepts, polarized X-ray absorption spectroscopy (XAS) and electron microscopy [20, 21]. It has many key strengths needed ultimately to solve the exchange bias puzzle. Because of the elemental and chemical specificity of XAS, one can tune into specific layers by tuning the photon energy.

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