By Bharat Bhushan, Harald Fuchs
The volumes XI, XII and XIII research the actual and technical starting place for contemporary growth in utilized scanning probe suggestions. the 1st quantity got here out in January 2004, the second one to fourth volumes in early 2006 and the 5th to 7th volumes in overdue 2006. the sector is progressing so quick that there's a desire for a collection of volumes each 12 to 18 months to seize most modern advancements. those volumes represent a well timed finished evaluate of SPM functions. After introducing scanning probe microscopy, together with sensor know-how and tip characterization, chapters on use in a number of commercial functions are awarded. commercial functions span topographic and dynamical floor stories of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters were written by means of top researchers and alertness scientists from worldwide and from a number of industries to supply a broader standpoint.
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Additional info for Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology) (No. XII)
99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . . . 113 Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Yaxin Song, Bharat Bhushan . . . . . . . . . . . 149 Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale Justyna Wiedemair, Boris Mizaikoff, Christine Kranz . . . . 225 New AFM Developments to Study Elasticity and Adhesion at the Nanoscale Robert Szoszkiewicz, Elisa Riedo .
131 Scanning Probe Microscope Application for Single Molecules in a π -Conjugated Polymer Toward Molecular Devices Based on Polymer Chemistry Ken-ichi Shinohara . . . . . . . . . . . . . 153 Scanning Probe Microscopy on Polymer Solar Cells Joachim Loos, Alexander Alexeev . . . . . . . . . 183 Scanning Probe Anodization for Nanopatterning Hiroyuki Sugimura . . . . . . . . . . . . . 217 34 Tissue Engineering: Nanoscale Contacts in Cell Adhesion to Substrates Mario D’Acunto, Paolo Giusti, Franco Maria Montevecchi, Gianluca Ciardelli .
The combined data (position of the tip and measured force) allows pinpointing the location of different adhesion areas on a cell surface. AFMs used in cell adhesion experiments usually need a piezocontrol element that retracts the cantilever by up to 15 μm or more from the sample contact point. Manually controlled micrometer screws can be used for the spatial adjustment of the cantilever tip. A standard light microscope (not shown), to which a video camera is attached, is placed underneath the sample stage of the AFM to monitor the fishing of the cell onto the tip of the cantilever and to focus the laser beam onto the cantilever.